Rotlex specializes in various methods of wavefront analysis. These methods are very efficient for characterizing transparent objects by analyzing light passing through them, or similarly, characterizing surfaces using reflected light. Rotlex instruments utilize Moire deflectometry, Lau effect, and shearing interferometry. Thes technologies have several advantages over other inspection methods; They enable development of devices which are: compact, robust, inexpensive, and capable of measuring objects with large variations (within the same object).
Rotlex is currently active mainly in the ophthalmic industry, serving the leading manufacturers of spectacle, contact, and intraocular lenses. Our wave front analyzers are carefully designed for specific needs of segments of the ophthalmic industry, in terms of: field of view, ranges of curvatures or focusing power, dynamic range, etc. The software running each of these instruments is also especially fit for the properties which need to be measured, and the mode of work common to most manufacturers in each field.
While Rotlex continuously improve existing products and add capabilities for dealing with new lenses introduced in the market, we also expand our activities to areas where the technology can be adapted. Among many potential applications we foresee good prospects in the following general application: