Rotlex specializes in various methods of wavefront analysis. These methods are very efficient for characterizing transparent objects by analyzing light passing through them, or similarly, characterizing surfaces using reflected light. Rotlex instruments utilize Moire deflectometry, Lau effect, and shearing interferometry. Thes technologies have several advantages over other inspection methods; They enable development of devices which are: compact, robust, inexpensive, and capable of measuring objects with large variations (within the same object).

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