Mapper

High-resolution lens inspection system

Rotlex Mapper is a high-resolution lens inspection system for spectacle lenses.

Within 3 seconds, the Mapper provides high resolution power and cylinder maps, of all types of lenses: Spheric, aspheric, toric, atoric, front, back and double progressive, bifocal, trifocal, polarized, unpolished, and more.

Other than the prescription values (Sph, Cyl, Ax, Add), the maps provide a huge wealth of information:

Lens design issues:

  • Corridor width
  • Corridor length
  • Symmetry
  • Size of far vision zone
  • Size of near vision zone
  • Amount of distortions
  • Soft/Hard power progression curve
  • Other power distribution issues

Lens manufacturing issues:

All these enable the following applications:

  • Verification of the prescription
  • Measuring unmarked lenses and finding the vision circles (can be done automatically)
  • QA – finding bad lenses with all types of defects
  • Detecting printing errors
  • Checking whether lens and frame match (by overlaying frame contour on the map)
  • A powerful tool for lens development as well as process optimization
  • Comparing competitors lenses to yours
  • Periodic testing for mold quality degradation
  • Marketing – Demonstrate the quality of your lenses

Specifications

Technical:

Light source:

Long-life green LED illumination

Power supply:

12VDC

Dimensions:

25X17X33 (DWH)

Weight:

3 kg.

 

Lens Types:

Spheric, aspheric, toric, atoric, front, back and double progressive,polarized, unpolished, and more.

 

Performance:

Power range:

-15D to +15D

Cylinder range:

up to 10D

Resolution:

adjustable 0.01D, 0.06D, 0.12D, 0.25D, 0.5D

Accuracy:

0.03D

Inspected area:

65mm

No. of data points:

> 30,000

 

Software

Operating system:

Windows XP/7/8

Exported data:

Maps in FFV-format, ASCII, jpg, bmp, Editable report page.

Communication:

Serial port, through shared folders, Lab’s network, direct access to lens designer’s server, also supports encrypted formats.

Interfacing:

Printer, barcode reader.

 

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